Media Summary: How to quantify thin film intensities measured using multi-voltage-analysis (MVA) on the electron microprobe using Presentation given by Anette von der Handt from the University of British Columbia at the 2024 Athens Presentation given by John Donovan from the University of Oregon and
Probe For Epma Sample Setup - Detailed Analysis & Overview
How to quantify thin film intensities measured using multi-voltage-analysis (MVA) on the electron microprobe using Presentation given by Anette von der Handt from the University of British Columbia at the 2024 Athens Presentation given by John Donovan from the University of Oregon and A presentation to the Chinese Academy of Geological Sciences in 2023 by John Donovan, titled: "Best Practices in Modern Recording of our group meeting on March 10th, 2021, where I presented a method to accurately quantify element maps obtained ...
