Media Summary: April 2/3, 2026 As high-performance computing and AI accelerators drive systems to unprecedented power levels, effective ... October 14, 2021 Project Chair: Wayne Zhang (IBM) Co-Chair: Philip A. Reyes (IMI) The electronics manufacturing industry is ... CAF (conductive anodic filament) failures are the result of an electrochemical migration (ECM) process that causes short circuits in ...
Inemi Call For Participation Webinar - Detailed Analysis & Overview
April 2/3, 2026 As high-performance computing and AI accelerators drive systems to unprecedented power levels, effective ... October 14, 2021 Project Chair: Wayne Zhang (IBM) Co-Chair: Philip A. Reyes (IMI) The electronics manufacturing industry is ... CAF (conductive anodic filament) failures are the result of an electrochemical migration (ECM) process that causes short circuits in ... January 17 & 18, 2022 The presentation from this project's recent Project Chair: Wayne Zhang (IBM) Co-Chair: Philip A. Reyes (IMI) Hybrid PCBs for Next Generation Applications Project December 7, 2022 An increasing range of high-speed applications require ...
